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Volumn 237-239, Issue 1-4 II, 2002, Pages 1410-1417

Microchannel epitaxy: An overview

Author keywords

A1. Defects; A3. Liquid phase epitaxy A3. Molecular beam epitaxy A3. Selective epitaxy; B2. Semiconducting gallium arsenides B2. Semiconducting gallium compounds B2. Semiconducting III V materials B2. Semiconducting silicon

Indexed keywords

AMORPHOUS FILMS; CRYSTAL DEFECTS; CRYSTAL LATTICES; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; THICKNESS MEASUREMENT;

EID: 0036530612     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)02227-8     Document Type: Article
Times cited : (68)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.