Effects of annealing and quenching treatments on reconstruction of rutile thin films on sapphire substrates

Surface Science

Volumn 499, Issue 2-3, 2002, Pages 203-209

  Choi, Yeongsoo ^a   Yamamoto, Shunya ^a   Abe, Hiroaki ^a   Itoh, Hisayosi ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Atomic force microscopy; Laser methods; Titanium oxide

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; PULSED LASER DEPOSITION; QUENCHING; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE STRUCTURE; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

SMOOTH SURFACES;

THIN FILMS;

EID: 0036499355     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01822-2     Document Type: Article

References (17)