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Volumn 479, Issue 2-3, 2002, Pages 487-497

Results of irradiation tests on standard planar silicon detectors with 7-10 MeV protons

Author keywords

Dectectors ageing; Low energy proton irradiation; Radiation hardness factors; Silicion detectors; Standard planar silicion diodes

Indexed keywords

AGING OF MATERIALS; DOPING (ADDITIVES); HARDNESS; PROTON IRRADIATION; SILICON;

EID: 0036494783     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00925-1     Document Type: Article
Times cited : (25)

References (30)
  • 13
    • 0006368529 scopus 로고    scopus 로고
    • STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy
  • 14
    • 0006318677 scopus 로고    scopus 로고
    • Wacker Siltronics, Burghausen, Germany


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.