Temperature dependence of low-frequency noise in Al-Al2O3-Al single-electron transistors

Journal of Applied Physics

Volumn 88, Issue 11, 2000, Pages 6536-6540

  Kenyon, M ^a   Lobb, C J ^a   Wellstood, F C ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000279043     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1312846     Document Type: Article

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