Data compression in space under generalized mergeability based on concepts of cover table and frequency ordering

IEEE Transactions on Instrumentation and Measurement

Volumn 51, Issue 1, 2002, Pages 150-172

  Das, Sunil R ^a,b   Liang, Jing Yi ^b   Petriu, Emil M ^a,b   Assaf, Mansour H ^b   Jone, Wen Ben ^a,c   Chakrabarty, Krishnendu ^a,d  

^a IEEE   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

^c 705 Engineering Research Center   (United States)

^d Duke University   (United States)

Author keywords

Built in self test (BIST); Circuit under test (CUT); Cover table; Derived sequences; Frequency ordering; Hamming distance; Missed error probability estimates; Optimal sequence merge ability; Parity tree space compactors; Sequence weights; Space compaction; Time compaction

Indexed keywords

CIRCUIT UNDER TEST; COVER TABLE; DERIVED SEQUENCES; FREQUENCY ORDERING; GENERALIZED MERGEABILITY; HAMMING DISTANCE; MISSED ERROR PROBABILITY ESTIMATES; OPTIMAL SEQUENCE MERGEABILITY; PARITY TREE SPACE COMPACTOR;

ALGORITHMS; BUILT-IN SELF TEST; DATA COMPRESSION; ESTIMATION; PROBABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0036476934     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.989919     Document Type: Article

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