GENERAL SCHEME TO OPTIMIZE ERROR MASKING IN BUILT-IN SELF-TESTING.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1986, Pages 410-415

  Zorian, Y ^a   Agarwal, V K ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS, DIGITAL - FAULT TOLERANT CAPABILITY; COMPUTERS, DIGITAL - SHIFT REGISTERS;

BUILT-IN SELF-TESTING; DATA COMPRESSION; ERROR MASKING; LINEAR FEEDBACK SHIFT REGISTER;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022604578     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)