In situ high-temperature x-ray diffraction study on domain evolution in ferroelectric (Pb,La)TiO3 epitaxial thin films

Journal of Applied Physics

Volumn 82, Issue 5, 1997, Pages 2532-2537

  Kang, Young Min ^a   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003183869     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366064     Document Type: Article

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