Nanostructure and thermoelectric properties of ReSi2±x thin films

Analytical and Bioanalytical Chemistry

Volumn 374, Issue 4, 2002, Pages 695-698

  Thomas, J ^a   Hofman, D ^a   Kleint, C ^a   Schumann, J ^a   Wetzig, K ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Electron diffraction; Nanocrystallites; Rhenium silicide; TEM; Thermoelectricity

Indexed keywords

CRYSTALLIZATION; HEAT TREATMENT; RHENIUM COMPOUNDS; THERMOELECTRICITY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

THERMOPOWER;

NANOSTRUCTURED MATERIALS;

CRYSTALLIN; RHENIUM; RHENIUM SILICIDE; UNCLASSIFIED DRUG;

ANALYTIC METHOD; CHEMICAL STRUCTURE; CONFERENCE PAPER; CORRELATION ANALYSIS; CRYSTALLIZATION; ELECTRIC FIELD; ELECTRIC RESISTANCE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FILM; FRACTIONATION; GRAIN; HEAT TREATMENT; NANOPARTICLE; PLANT GROWTH; TEMPERATURE DEPENDENCE; THERMAL ANALYSIS;

EID: 0036460697     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-002-1502-9     Document Type: Conference Paper

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