Structure of nanocrystalline Re-Si thin film composites and their unusual thermoelectric properties

Journal of Applied Physics

Volumn 89, Issue 6, 2001, Pages 3229-3241

  Pitschke, W ^a   Hofman, D ^a   Schumann, J ^a   Kleint, C A ^a   Heinrich, A ^a   Burkov, A T ^b  

^a IFW DRESDEN   (Germany)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035868114     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1333738     Document Type: Article

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