SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 81, Issue 3-4, 2000, Pages 271-277

Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopy

(4) Hofman, D a Kleint, C a Thomas, J a Wetzig, K a

a IFW DRESDEN (Germany)

Author keywords

Electron diffraction; Energy filtered imaging and diffraction; In situ specimen treatment

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; IMAGING TECHNIQUES; MICROSTRUCTURE; RHENIUM COMPOUNDS; SEMICONDUCTING SILICON; SPUTTER DEPOSITION; TEMPERATURE; THIN FILMS;

ENERGY FILTERED IMAGING; IN SITU ANNEALING; RADIAL DISTRIBUTION FUNCTION; TEMPERATURE COEFFICIENT; THERMOELECTRIC SILICIDE;

TRANSMISSION ELECTRON MICROSCOPY;

RHENIUM COMPLEX; SILICON;

ARTICLE; FILM; IMAGING; TECHNIQUE; TECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034106308 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(99)00181-3 Document Type: Article

Times cited : (7)

References (11)

1
- 0000169967
- Burkov A.T., Heinrich A., Gladun C., Pitschke W., Schumann J. Phys. Rev. B. 58:1998;9644.
- (1998) Phys. Rev. B , vol.58 , pp. 9644
- Burkov, A.T.¹ Heinrich, A.² Gladun, C.³ Pitschke, W.⁴ Schumann, J.⁵

2
- 36449009417
- Bergman D.J., Levy O. J. Appl. Phys. 70:1991;6821.
- (1991) J. Appl. Phys. , vol.70 , pp. 6821
- Bergman, D.J.¹ Levy, O.²

3
- 0001939144
- Reiche R., Oswald S., Hofman D., Thomas J., Wetzig K. Fres. J. Anal. Chem. 365:1999;76.
- (1999) Fres. J. Anal. Chem. , vol.365 , pp. 76
- Reiche, R.¹ Oswald, S.² Hofman, D.³ Thomas, J.⁴ Wetzig, K.⁵

4
- 0000695378
- Hicks L.D., Harman T.C., Sun X., Dresselhaus M.S. Phys. Rev. B. 53:1996;R10493.
- (1996) Phys. Rev. B , vol.53 , pp. 10493
- Hicks, L.D.¹ Harman, T.C.² Sun, X.³ Dresselhaus, M.S.⁴

5
- 84888053664
- Cockayne D.J.H., McKenzie D.R. Acta Crystallogr. A. 44:1988;870.
- (1988) Acta Crystallogr. a , vol.44 , pp. 870
- Cockayne, D.J.H.¹ McKenzie, D.R.²

6
- 0000421562
- Cockayne D.J.H., McKenzie D.R., Muller D. Microsc. Microanal. Microstruct. 2:1991;359.
- (1991) Microsc. Microanal. Microstruct. , vol.2 , pp. 359
- Cockayne, D.J.H.¹ McKenzie, D.R.² Muller, D.³

7
- 0000678646
- Thomas J., Schumann J., Pitschke W. Fres. J. Anal. Chem. 358:1997;325.
- (1997) Fres. J. Anal. Chem. , vol.358 , pp. 325
- Thomas, J.¹ Schumann, J.² Pitschke, W.³

8
- 0343815043
- C.A. Kleint, A. Heinrich, J. Schumann, H. Vinzelberg, H. Griessmann, D. Hofman, D. Schlaefer, G. Behr, L. Ivanenko, in: MRS Symposium Proceedings, 1998, p. 545.
- (1998) In: MRS Symposium Proceedings , pp. 545
- Kleint, C.A.¹ Heinrich, A.² Schumann, J.³ Vinzelberg, H.⁴ Griessmann, H.⁵ Hofman, D.⁶ Schlaefer, D.⁷ Behr, G.⁸ Ivanenko, L.⁹

9
- 0026765659
- Mahan J.E., Bai G., Nicolet M.-A., Long R.G., Geib K.M. Thin Solid Films. 207:1992;223.
- (1992) Thin Solid Films , vol.207 , pp. 223
- Mahan, J.E.¹ Bai, G.² Nicolet, M.-A.³ Long, R.G.⁴ Geib, K.M.⁵

10
- 0342944035
- Mahan J.E., Geib K.M., Robinson G.Y., Long R.G., Yan Xinghua, Bai G., Nicolet M.-A., Nathan M. Appl Phys. Lett. 56:1990;2439.
- (1990) Appl Phys. Lett. , vol.56 , pp. 2439
- Mahan, J.E.¹ Geib, K.M.² Robinson, G.Y.³ Long, R.G.⁴ Yan Xinghua⁵ Bai, G.⁶ Nicolet, M.-A.⁷ Nathan, M.⁸

11
- 0029345046
- Bauer H.-D., Thomas J., Wetzig K. Phys. Stat. Sol. A. 150:1995;141.
- (1995) Phys. Stat. Sol. a , vol.150 , pp. 141
- Bauer, H.-D.¹ Thomas, J.² Wetzig, K.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.