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Volumn 717, Issue , 2002, Pages 225-230

Modeling of self-interstitial diffusion in implanted molecular beam epitaxy silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; COMPUTER SIMULATION; DIFFUSION; DISSOLUTION; EVAPORATION; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR DOPING; SURFACE PHENOMENA;

EID: 0036453146     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.