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Volumn 717, Issue , 2002, Pages 225-230
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Modeling of self-interstitial diffusion in implanted molecular beam epitaxy silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
COMPOSITION;
COMPUTER SIMULATION;
DIFFUSION;
DISSOLUTION;
EVAPORATION;
MOLECULAR BEAM EPITAXY;
SEMICONDUCTOR DOPING;
SURFACE PHENOMENA;
SELF-INTERSTITIAL DIFFUSION;
SEMICONDUCTING SILICON;
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EID: 0036453146
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (12)
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