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Volumn 4778, Issue , 2002, Pages 198-205

Simultaneous distance, slope, curvature and shape measurement with a multi-purpose interferometer

Author keywords

Aspheres; Complex surfaces; Curvature; Fringe processing; Global optimization; Interferometer design; Topography

Indexed keywords

DISTANCE MEASUREMENT; GLOBAL OPTIMIZATION; INTERFEROMETRY; LASER BEAMS; SURFACE MEASUREMENT; SURFACE TOPOGRAPHY; WAVEFRONTS;

EID: 0036425557     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.473554     Document Type: Conference Paper
Times cited : (13)

References (8)
  • 1
    • 0035075840 scopus 로고    scopus 로고
    • Topography Measurement by a reliable large-area curvature sensor
    • M. Schulz, "Topography Measurement by a Reliable Large-Area Curvature Sensor", Optik 112, pp. 86-90, 2001.
    • (2001) Optik , vol.112 , pp. 86-90
    • Schulz, M.1
  • 2
    • 0001030264 scopus 로고    scopus 로고
    • Interferometric testing of plane and cylindrical workpieces with computer-generated holograms
    • S. Brinkmann, R. Schreiner, T. Dresel, J. Schwider, "Interferometric testing of plane and cylindrical workpieces with computer-generated holograms", Opt. Eng. 37, pp. 2506-2511, 1998.
    • (1998) Opt. Eng. , vol.37 , pp. 2506-2511
    • Brinkmann, S.1    Schreiner, R.2    Dresel, T.3    Schwider, J.4
  • 4
    • 0033657735 scopus 로고    scopus 로고
    • A reliable curvature sensor for measuring the topography of complex surfaces
    • M. Schulz, P. Thomsen-Schmidt, I. Weingärtner, "A reliable curvature sensor for measuring the topography of complex surfaces," Proc. SPIE 4098, pp 84-93, 2000.
    • (2000) Proc. SPIE , vol.4098 , pp. 84-93
    • Schulz, M.1    Thomsen-Schmidt, P.2    Weingärtner, I.3
  • 5
    • 0033658793 scopus 로고    scopus 로고
    • A facility for the curvature-based measurement of the nanotopography of complex surfaces
    • P. Thomsen-Schmidt, M. Schulz, I. Weingärtner, "A facility for the curvature-based measurement of the nanotopography of complex surfaces", Proc. SPIE 4098, pp. 94-101, 2000.
    • (2000) Proc. SPIE , vol.4098 , pp. 94-101
    • Thomsen-Schmidt, P.1    Schulz, M.2    Weingärtner, I.3
  • 6
    • 0025558304 scopus 로고
    • Angstrom level profilometry for sub-millimeter to meter scale surface errors
    • P. Glenn, "Angstrom level profilometry for sub-millimeter to meter scale surface errors", Proc. SPIE 1333, pp. 326-336, 1990.
    • (1990) Proc. SPIE , vol.1333 , pp. 326-336
    • Glenn, P.1
  • 7
    • 0035761147 scopus 로고    scopus 로고
    • Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 °C to 28 °C and compressibility
    • R. Schödel, G. Bönsch, "Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 °C to 28 °C and compressibility", Proc. SPIE 4410, pp. 54-62, 2001.
    • (2001) Proc. SPIE , vol.4410 , pp. 54-62
    • Schödel, R.1    Bönsch, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.