Reliable curvature sensor for measuring the topography of complex surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4098, Issue , 2000, Pages 84-93

  Schulz, Michael ^a   Thomsen Schmidt, Peter ^a   Weingaertner, Ingolf ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; PRECISION ENGINEERING; SENSORS;

ASPHERES; CURVATURE SENSORS;

OPTICAL SYSTEMS;

EID: 0033657735     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)