메뉴 건너뛰기




Volumn 4691 I, Issue , 2002, Pages 407-417

Model assisted double dipole decomposition

Author keywords

Dipole Illumination; Double Exposure; Low k1 imaging; Microlithography; Model Based OPC

Indexed keywords

IMAGING TECHNIQUES; MASKS; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; PHASE SHIFT;

EID: 0036416660     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.474589     Document Type: Conference Paper
Times cited : (18)

References (7)
  • 1
    • 0033712150 scopus 로고    scopus 로고
    • Forbidden Pitches for 130 nm lithography and below
    • Optical Microlithography XIII
    • Socha et al. "Forbidden Pitches for 130 nm lithography and below", in Optical Microlithography XIII, Proc. SPIE Vol.4000 (2000), 1140-1155.
    • (2000) Proc. SPIE , vol.4000 , pp. 1140-1155
    • Socha1
  • 2
    • 0010936728 scopus 로고    scopus 로고
    • Resolution enhancement techniques: In optical lithography
    • SPIE Press
    • A.K. Wong. "Resolution Enhancement Techniques: In Optical Lithography", SPIE Press, Tutorial texts in Optical Engineering. V. TT47, pp. 80-83.
    • Tutorial texts in Optical Engineering , vol.TT47 , pp. 80-83
    • Wong, A.K.1
  • 3
    • 0034844427 scopus 로고    scopus 로고
    • 0.11-mum imaging in KrF lithography using dipole illumination
    • M. Eurlings, E. Van Setten, et al. "0.11-mum imaging in KrF lithography using dipole illumination", Proc. SPIE. 4404, pp.266-278, 2001.
    • (2001) Proc. SPIE. , vol.4404 , pp. 266-278
    • Eurlings, M.1    Van Setten, E.2
  • 4
    • 0034541668 scopus 로고    scopus 로고
    • Effects of advanced illumination schemes on design manufacturability and interactions with optical proximity corrections
    • L. Capodieci, J.A. Torres, et al. "Effects of advanced illumination schemes on design manufacturability and interactions with optical proximity corrections". Proc. SPIE 2000, no. 4181, pp. 58-6, 2000.
    • (2000) Proc. SPIE , vol.2000 , Issue.4181 , pp. 58-66
    • Capodieci, L.1    Torres, J.A.2
  • 5
    • 0034538628 scopus 로고    scopus 로고
    • Subresolution process windows and yield estimation technique based on detailed full-chip CD simulation
    • Y. Granik, N. Cobb, "Subresolution process windows and yield estimation technique based on detailed full-chip CD simulation" Proc. SPIE, no. 4182, pp. 335-341, 2000.
    • (2000) Proc. SPIE , Issue.4182 , pp. 335-341
    • Granik, Y.1    Cobb, N.2
  • 6
    • 0034430579 scopus 로고    scopus 로고
    • Optimization of Dipole Off-Axis Illumination by 1st-Order Efficiency Method for Sub-120 nm Node with KrF Lithography
    • S. Kim, C. Bang, et al. "Optimization of Dipole Off-Axis Illumination by 1st-Order Efficiency Method for Sub-120 nm Node with KrF Lithography". Japanese Journal of Applied Physics Part 1, V.39 (2000), N.12B, pp. 6777-6780.
    • (2000) Japanese Journal of Applied Physics Part 1 , vol.39 , Issue.12 B , pp. 6777-6780
    • Kim, S.1    Bang, C.2
  • 7
    • 0029492542 scopus 로고
    • Fast sparse aerial image calculation for OPC
    • N. Cobb, A. Zakhor, "Fast sparse aerial image calculation for OPC", Proc. SPIE. 2621, pp.534-535, 1995.
    • (1995) Proc. SPIE , vol.2621 , pp. 534-535
    • Cobb, N.1    Zakhor, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.