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Volumn 693, Issue , 2002, Pages 455-460

Characteristics of deep traps in freestanding GaN

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTER SIMULATION; CRYOSTATS; CURRENT VOLTAGE CHARACTERISTICS; DEEP LEVEL TRANSIENT SPECTROSCOPY; SCHOTTKY BARRIER DIODES; THERMIONIC EMISSION;

EID: 0036377262     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.