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Volumn 688, Issue , 2002, Pages 193-198
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Interdigital Ag(Ta, Nb)O3 thin film capacitors on sapphire
a a a a |
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITORS;
CRYSTAL GROWTH;
CURRENT VOLTAGE CHARACTERISTICS;
DIELECTRIC RELAXATION;
ELECTRIC CONDUCTIVITY MEASUREMENT;
FERROELECTRIC THIN FILMS;
PERMITTIVITY;
PHOTOLITHOGRAPHY;
POLARIZATION;
PULSED LASER DEPOSITION;
SAPPHIRE;
X RAY DIFFRACTION ANALYSIS;
CURIE VON SCHWEIDLER TYPE RELAXATION;
FREQUENCY DISPERSION;
GAP INTERDIGITAL CAPACITORS;
THIN FILM CAPACITORS;
SEMICONDUCTING SILVER COMPOUNDS;
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EID: 0036353528
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (12)
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