Ion-beam-induced structural changes in MgAl2O4 and TiO2

Journal of Electron Microscopy

Volumn 51, Issue SUPPL., 2002, Pages

  Ishimaru, M ^a   Hirotsu, Y ^a   Sickafus, K E ^b  

^a OSAKA UNIVERSITY   (Japan)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

High resolution transmission electron microscopy; Ion irradiation; Rutile; Selected area electron diffraction; Spinel; Structural changes

Indexed keywords

EID: 0036289823     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.supplement.s219     Document Type: Conference Paper

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