Quantitative electron diffraction study of cation configuration and irradiation induced displacement in magnesium aluminate spinel crystals

Journal of Electron Microscopy

Volumn 48, Issue 5, 1999, Pages 531-536

  Soeda, Takeshi ^a   Matsumura, Syo ^a   Hayata, Jiro ^a   Kinoshita, Chiken ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Channelling enhanced X ray analysis; Energy filtering; LACBED; Radiation effects

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONS; MAGNESIA; POSITIVE IONS; RADIATION EFFECTS; SINGLE CRYSTALS; SODIUM ALUMINATE; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

CHANNELING ENHANCED X-RAY ANALYSE; ELECTRON DIFFRACTION STUDY; ENERGY FILTERING; LACBED; MAGNESIUM ALUMINATE SPINEL; MEV-ELECTRONS; O+ IONS; QUANTITATIVE ELECTRON DIFFRACTION; SPINEL CRYSTALS; TETRAHEDRAL SITES;

IRRADIATION;

EID: 0032741147     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023712     Document Type: Article

References (23)

1. 4 ceramics. J. Nucl. Mater. 108-109: 655-670
2. Clinard Jr F W, Hurley G F, Hobbs L W, Rohr D L and Youngman R A (1985) Structural performance of ceramics in a high-fluence fusion environment. J. Nucl. Mater. 123: 1386-1392.
3. 3 through the formation process of defect clusters under irradiation. Nucl. Inst. Meth. Phys. Res. B 91: 252-257.
4. Zinkle S and Kinoshita C (1997) Defect production in ceramics. J. Nucl Mater. 251: 200-217.
5. Yasuda K, Kinoshita C, Morisaki R and Abe H (1998) Role of irradiation spectrum in the microstructural evolution of magnesium alminate spinel. Philos. Mag. A 78: 583-598.
6. 4 spinel. Philos. Mag. Lett. 70: 235-240.
7. Sickafus K E, Larson A C, Yu N, Nastasi M, Hollenberg G W, Garner F A and Bradt R C (1995) Cation disorder in high dose, neutron-irradiated spinel. J. Nucl. Mater. 219: 128-134.
8. 3 spinel single crystal under high-fluence ion-irradiation. Nucl. lnst. Meth. Phys. Res. B 106: 573-578.
9. Bordes N, Sickafus K E, Cooper E A and Ewing R C(1995) Structural damage in spinel after ion irradiation. J. Nucl. Mater. 225: 318-323.
10. Devanathan R, Sickafus K E, Yu N and Nastasi M (1995) Structure of the metastable state in ion-irradiated magnesio-aluminate spinel. Philos. Mag. Lett. 72: 155-161.
11. 4 spinel. J. Mater. Res. 12: 1766-1770.
12. Spence J C H (1992) Electron channelling and its uses. In: Electron Diffraction Techniques Vol. 1, ed. Cowley J M, pp. 465-532 (Oxford University Press, Oxford).
13. Spence JCH and Zuo J M (1992) Electron Microdiffraaion (Plenum Press, New York).
14. Matsumura S, Morimura T and Oki K (1991) An analytical electron diffraction technique for the determination of long-range order parameters in multi-component ordered alloys. Mater. Trans. JIM 32: 905-910.
15. 0-type order in Cu-Au-Pd and Cu-Au-Ni ternary alloys. Philos. Mag. A 76: 1235-1249.
16. Matsumura S, Furuse T and Oki K (1998) Time-evolution of long range ordering in CuAuPd ternary alloys. Mater. Trans. JIM 39: 159-168.
17. Gjønnes J and Høier R (1971) The application of non-systematic many-beam dynamic effects to structure-factor determination. Acts Cryst. A 27: 313-316.
18. Mayer J, Deininger C and Reimer L (1995) Electron spectroscopic diffraction. In: Energy-Filtering Transmission Electron Microscopy, ed. Reimer L, pp. 291-345 (Springer, Berlin).
19. Tsuno K, Kaneyama T, Honda T, Tsuda K, Terauchi M and Tanaka M (1997) Design and testing of omega mode imaging energy filters at 200 kV. J. Electron Microsc. 46: 357-368.
20. Tsuno K, Kaneyama T, Honda T and Ishida Y (1998) Non-isochromaticity of an omega filter in a 200 kV transmission electron microscope. J. Electron Microsc. 47: 611-619.
21. Rez D, Rez P and Grant I (1994) Dirac-Fock calculations of x-ray scattering factors and contributions to the mean inner potential for electron scattering. Acta Cryst. A 50: 481-497.
22. Zuo J M, O'keeffe M, Rez P and Spence J C H (1997) Charge density of MgO: implications of precise new measurements for theory. Phys. Rev. Lett. 78: 4777-4780.
23. Allen L J, Josefsson T W and Rossouw C W (1994) Interaction delocalization in characteristic X-ray emission from light elements. Ultramicroscopy 55: 258-267.