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Volumn 141, Issue 1-4, 1998, Pages 312-325

Applications of advanced electron microscopy techniques to the studies of radiation effects in ceramic materials

Author keywords

Amorphization; Ceramics; Radiation effects; Transmission electron microscopy

Indexed keywords

AMORPHIZATION; IMAGE ANALYSIS; INSULATING MATERIALS; ION BEAMS; ION BOMBARDMENT; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032066832     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00151-7     Document Type: Article
Times cited : (43)

References (74)
  • 10
    • 0026188876 scopus 로고
    • W.J. Weber, JOM 43 (1991) 35.
    • (1991) JOM , vol.43 , pp. 35
    • Weber, W.J.1
  • 11
    • 0347887048 scopus 로고    scopus 로고
    • MRS, Pittsburgh, PA
    • See in situ electron and tunneling microscopy of dynamic processes, R. Sharma et al. (Eds.), MRS Symposium Proceedings 404, MRS, Pittsburgh, PA, 1996.
    • (1996) MRS Symposium Proceedings , vol.404
    • Sharma, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.