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Volumn 20, Issue 1, 2002, Pages 174-179

Ti diffusion in ion prebombarded MgO(100). I. A model for quantitative analysis

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; DEFECTS; DIFFUSION IN SOLIDS; EVAPORATION; HARDENING; ION BOMBARDMENT; MATHEMATICAL MODELS; SECONDARY ION MASS SPECTROMETRY; TITANIUM;

EID: 0036160358     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1427885     Document Type: Article
Times cited : (8)

References (31)
  • 23
    • 0008190021 scopus 로고    scopus 로고
    • Materials Technology International, 5327 Jacuzzi St., Richmond, CA 94804


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.