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Surface Science

Volumn 383, Issue 2-3, 1997, Pages 268-276

Preparation and characterization of MgO(100) surfaces

(2) Perry, Scott S a Merrill, Philip B a

a University of Houston (United States)

Author keywords

Atomic force microscopy; Etching; Low energy electron diffraction; Magnesium oxide; Surface roughness and topography

Indexed keywords

ANISOTROPY; ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; ETCHING; LOW ENERGY ELECTRON DIFFRACTION; POLISHING; SURFACE ROUGHNESS; VACUUM APPLICATIONS;

ACID ETCHING; MECHANICAL POLISHING; OXIDATIVE ANNEALING; SURFACE TOPOGRAPHY; VACUUM ANNEALING;

MAGNESIA;

EID: 0031185856 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(97)00185-4 Document Type: Article

Times cited : (50)

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