Yield learning and the sources of profitability in semiconductor manufacturing and process development

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2002, Pages 324-329

  Weber, Charles ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Profitability; Semiconductor manufacturing; Yield learning

Indexed keywords

CMOS INTEGRATED CIRCUITS; INDUSTRIAL ECONOMICS; INDUSTRIAL ELECTRONICS; MATHEMATICAL MODELS; PRODUCT DEVELOPMENT; PRODUCTIVITY;

PROCESS DEVELOPMENT; PROFITABILITY; YIELD LEARNING;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0036079404     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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