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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 3, 2002, Pages 1229-1233

High reflectivity and crack-free AlGaN/AlN ultraviolet distributed Bragg reflectors

(7) Bhattacharyya, A a Iyer, Sandeep a Iliopoulos, E a Sampath, A V a Cabalu, J a Moustakas, T D a Friel, I b

a Boston University (United States)

b Boston University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; COATINGS; COMPRESSIVE STRESS; COMPUTER SIMULATION; CRACK PROPAGATION; ELECTROMAGNETIC WAVE REFLECTION; MIRRORS; MOLECULAR BEAM EPITAXY; NUCLEATION; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; TENSILE STRESS; ULTRAVIOLET RADIATION;

DISTRIBUTED BRAGG REFLECTORS (DBR);

OPTOELECTRONIC DEVICES;

EID: 0035998571 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1482070 Document Type: Conference Paper

Times cited : (44)

References (16)

1
- 0346429243
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1
- Redwing, J.M.¹ Loeber, D.A.S.² Anderson, N.G.³ Tischler, M.A.⁴ Flynn, J.S.⁵

2
- 0032606508
- (1999) Appl. Phys. Lett. , vol.74 , pp. 3441
- Song, Y.-K.¹ Zhou, H.² Diagne, M.³ Ozden, I.⁴ Vertikov, A.⁵ Nurmikko, A.V.⁶ Carter-Coman, C.⁷ Kern, R.S.⁸ Kish, F.A.⁹ Krames, M.R.¹⁰

3
- 0032614878
- (1999) Appl. Phys. Lett. , vol.75 , pp. 1192
- Krestnikov, L.¹ Lundin, W.V.² Sakharov, A.V.³ Semenov, V.A.⁴ Usikov, A.S.⁵ Tsatsul'nikov, A.F.⁶ Alferov, Zh.I.⁷ Ledentsov, N.N.⁸ Hoffmann, A.⁹ Bimberg, D.¹⁰

4
- 0009683970
- Baltimore, MD
- (1999) Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science , pp. 23
- Li, T.¹ Carrano, J.C.² Eiting, C.J.³ Grudowski, P.A.⁴ Lambert, D.J.H.⁵ Kwon, H.K.⁶ Dupuis, R.D.⁷ Campbell, J.C.⁸

5
- 0035475198
- (2001) Appl. Phys. Lett. , vol.79 , pp. 2136
- Fernández, S.¹ Naranjo, F.B.² Calle, F.³ Sánchez-García, M.A.⁴ Calleja, E.⁵ Vennegues, P.⁶ Trampert, A.⁷ Ploog, K.H.⁸

6
- 0000534813
- (1991) Appl. Phys. Lett. , vol.59 , pp. 1449
- Asif Khan, M.¹ Kuznia, J.N.² Van Hove, J.M.³ Olson, D.T.⁴

7
- 0001747526
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1036
- Ng, H.M.¹ Doppalapudi, D.² Iliopoulos, E.³ Moustakas, T.D.⁴

8
- 0000397045
- (2000) Appl. Phys. Lett. , vol.76 , pp. 2818
- Ng, H.M.¹ Moustakas, T.D.² Chu, S.N.G.³

9
- 0035927009
- (2001) Appl. Phys. Lett. , vol.78 , pp. 3205
- Waldrip, K.E.¹ Han, J.² Figiel, J.J.³ Zhou, H.⁴ Makarona, E.⁵ Nurmikko, A.V.⁶

10
- 0001607822
- (1998) Appl. Phys. Lett. , vol.73 , pp. 3653
- Someya, T.¹ Arakawa, Y.²

11
- 0003630507
- McGraw-Hill, New York
- (1988) Mechanical Metallurgy
- Dieter, G.E.¹

12
- 0003415938
- McGraw-Hill, New York
- (1989) Thin Film Optical Filters, 2nd ed.
- Macleod, H.A.¹

13
- 0001275895
- (2001) J. Appl. Phys. , vol.89 , pp. 2676
- Tisch, U.¹ Meyler, B.² Katz, O.³ Finkman, E.⁴ Salzman, J.⁵

14
- 1842724516
- (1997) J. Appl. Phys. , vol.82 , pp. 5090
- Brunner, D.¹ Angerer, H.² Bustarret, E.³ Freudenberg, F.⁴ Höpler, R.⁵ Dimitrov, R.⁶ Ambacher, O.⁷ Stutzmann, M.⁸

15
- 0011478396
- (2001) J. Cryst. Growth , vol.227-228 , pp. 13
- Moustakas, T.D.¹ Iliopoulos, E.² Sampath, A.V.³ Ng, H.M.⁴ Doppalapudi, D.⁵ Misra, M.⁶ Korakakis, D.⁷ Singh, R.⁸

16
- 0035915298
- (2001) Mater. Sci. Eng., B , vol.87 , pp. 227
- Iliopoulos, E.¹ Ludwig K.F., Jr.² Moustakas, T.D.³ Kominou, Ph.⁴ Karakostas, Th.⁵ Nouet, G.⁶ Chu, S.N.G.⁷

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