High-sensitivity CCD image sensor using capacitive-inverted-feedback source-follower circuit

Journal of the Korean Physical Society

Volumn 41, Issue 4, 2002, Pages 547-551

  Park, Sangsik ^a   Uh, Hyungsoo ^a   Choi, Seokrim ^a   Nam, Junghyun ^b  

^a Sejong University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

CCD; Feedback; Image sensor; Sensitivity; Source follower

Indexed keywords

EID: 0035981415     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (9)

1. E.R. Fossum, IEEE Trans. Electron Dev. 44, 1689 (1997).
2. Y. Shin, K. Lee, T. Jeong, H. Shin, T. Kim, P. Yu and K. Hong, J. Korean Phys. Soc. 26, S138 (1993).
3. S.H. Lee, J. Korean Phys. Soc. 39, 369 (2001).
4. A. Asai, Y. Toumiya, K. Matsuzaki, K. Nigawara, S. Kitayama, Y. Wataya and K. Masuda, Proc. IEEE Workshop on CCD's and Advanced Image Sensors (Brugge, Belgium, 1997), p. 35.
5. S. Yoon, O. Kwon and T. Won, J. Korean Phys. Soc. 39, 87 (2001).
6. T. Satoh, N. Mutoh, M. Furumiya, I. Murakami, S. Suwazono, C. Ogawa, K. Hatano, H. Utsumi, S. Kawai, K. Arai, M. Morimoto, K. Orihara, T. Tamura, N. Teranishi and Y. Hokari, IEEE Trans. Electron Dev. 44, 1599 (1997).
7. K. Itakura, T. Nobusada, N. Kokusenya, R. Nagayoshi and M. Ozaki, IEEE Trans. Electron Dev. 47, 65 (2000).
8. K. Hatano, M. Furumiya, Y. Nakashiba, I. Murakami, T. Kawasaki, T. Yamada, T. Nakano, Y. Kawasami and Y. Hokari, ITE Technical Report 23, 17 (1999).
9. Y. Jang, S. Yoo and J. Ro, J. Korean Phys. Soc. 33, S239 (1998).