Evaluating optical techniques for determining film structure: Optical invariants for anisotropic dielectric thin films

Langmuir

Volumn 17, Issue 19, 2001, Pages 5872-5881

  Mann, E K ^a  

^a KENT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL DISTRIBUTION;

ADSORPTION; ANISOTROPY; DIELECTRIC FILMS; MATHEMATICAL MODELS; OPTICAL WAVEGUIDES; PARAMETER ESTIMATION; SPECTROSCOPIC ANALYSIS;

THIN FILMS;

EID: 0035909154     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001746d     Document Type: Article

References (48)

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