Sensitivity of optical methods to the homogeneity of particulate layers

Journal of Chemical Physics

Volumn 108, Issue 17, 1998, Pages 7416-7425

  Mann, E K ^a,f   Heinrich, L ^b   Semmler, M ^a   Voegel, J C ^c   Schaaf, P ^b,d,e  

^a ETH ZURICH   (Switzerland)

^b INSTITUT CHARLES SADRON   (France)

^c UNIVERSITÉ DE STRASBOURG   (France)

^d Ecole Europeenne de Chimie   (France)

^e Institut Universitaire de

^f KENT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; DEPOSITION; FUNCTIONS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); REFLECTOMETERS; THIN FILMS;

INHOMOGENEITY; INVARIANT THEORY; OPTICAL INVARIANT; PARTICULATE LAYERS; RADIAL DISTRIBUTION FUNCTION; REFLECTIVITY; SCANNING ANGLE REFLECTOMETRY;

SURFACES;

EID: 0032073088     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.476162     Document Type: Article

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