A comparison between light reflectometry and ellipsometry in the rayleigh regime

Journal of Physical Chemistry B

Volumn 104, Issue 42, 2000, Pages 9878-9886

  Van Duijvenbode, René C ^a   Koper, Ger J M ^b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ELLIPSOMETRY; RAYLEIGH SCATTERING; REFLECTOMETERS;

BREWSTER ANGLE; FIXED ANGLE REFLECTOMETRY; RAYLEIGH PARTICLES; SCANNING ANGLE REFLECTOMETRY;

PARTICLE SIZE ANALYSIS;

EID: 0034297174     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp001832m     Document Type: Article

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