Characterization of thin protein films through scanning angle reflectometry

Langmuir

Volumn 13, Issue 12, 1997, Pages 3177-3186

  Heinrich, L ^a   Mann, E K ^a,b,d   Voegel, J C ^b   Schaaf, P ^a,c,e  

^a INSTITUT CHARLES SADRON   (France)

^b UNIVERSITÉ DE STRASBOURG   (France)

^c Ecole Europeenne de Chimie   (France)

^d ETH ZURICH   (Switzerland)

^e INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000858796     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9610314     Document Type: Article

References (35)

1. Lee, L. T.; Guiselin, O.; Farnoux, B.; Lapp, A. Macromolecules 1991, 24, 2518. Henderson, J. A.; Richards, R. W.; Penfold, J.; Thomas, R. K. Macromolecules 1993, 26, 65. Karim, A.; Satija, S. K.; Douglas, J. F.; Ankner, J. F.; Fetters, L. J. Phys. Rev. Lett. 1994, 73, 3407.
2. Lee, L. T.; Guiselin, O.; Farnoux, B.; Lapp, A. Macromolecules 1991, 24, 2518. Henderson, J. A.; Richards, R. W.; Penfold, J.; Thomas, R. K. Macromolecules 1993, 26, 65. Karim, A.; Satija, S. K.; Douglas, J. F.; Ankner, J. F.; Fetters, L. J. Phys. Rev. Lett. 1994, 73, 3407.
3. Lee, L. T.; Guiselin, O.; Farnoux, B.; Lapp, A. Macromolecules 1991, 24, 2518. Henderson, J. A.; Richards, R. W.; Penfold, J.; Thomas, R. K. Macromolecules 1993, 26, 65. Karim, A.; Satija, S. K.; Douglas, J. F.; Ankner, J. F.; Fetters, L. J. Phys. Rev. Lett. 1994, 73, 3407.
4. Crowley, T. L.; Lee, E. M.; Simister, E. A.; Thomas, R. K. Physica B 1991, B173, 143. Sivia, D. S.; Hamilton, W. A.; Smith, G. S. Physica B 1991, 173, 121. Chen, S. H.; Zhou, X. L.; Carvalho, B. L. Prog. Colloid. Polym. Sci. 1993, 93, 85. Bucknall, D. G.; Fernàndez, M. L.; Higgens, J. S. Faraday Discuss. 1994, 98, 19.
5. Crowley, T. L.; Lee, E. M.; Simister, E. A.; Thomas, R. K. Physica B 1991, B173, 143. Sivia, D. S.; Hamilton, W. A.; Smith, G. S. Physica B 1991, 173, 121. Chen, S. H.; Zhou, X. L.; Carvalho, B. L. Prog. Colloid. Polym. Sci. 1993, 93, 85. Bucknall, D. G.; Fernàndez, M. L.; Higgens, J. S. Faraday Discuss. 1994, 98, 19.
6. Crowley, T. L.; Lee, E. M.; Simister, E. A.; Thomas, R. K. Physica B 1991, B173, 143. Sivia, D. S.; Hamilton, W. A.; Smith, G. S. Physica B 1991, 173, 121. Chen, S. H.; Zhou, X. L.; Carvalho, B. L. Prog. Colloid. Polym. Sci. 1993, 93, 85. Bucknall, D. G.; Fernàndez, M. L.; Higgens, J. S. Faraday Discuss. 1994, 98, 19.
7. Crowley, T. L.; Lee, E. M.; Simister, E. A.; Thomas, R. K. Physica B 1991, B173, 143. Sivia, D. S.; Hamilton, W. A.; Smith, G. S. Physica B 1991, 173, 121. Chen, S. H.; Zhou, X. L.; Carvalho, B. L. Prog. Colloid. Polym. Sci. 1993, 93, 85. Bucknall, D. G.; Fernàndez, M. L.; Higgens, J. S. Faraday Discuss. 1994, 98, 19.
8. Tien, P. K. Rev. Mod. Phys. 1977, 49, 361. Rondelez, F.; Ausserré, D.; Hervet, H. Annu. Rev. Phys. Chem. 1987, 38, 317.
9. Tien, P. K. Rev. Mod. Phys. 1977, 49, 361. Rondelez, F.; Ausserré, D.; Hervet, H. Annu. Rev. Phys. Chem. 1987, 38, 317.
10. Meunier, J. In Light Scattering by Liquid Surfaces and Complementary Techniques; Langevin, D., Ed.; Marcel Dekker, Inc.: New York, 1992; p 17.
11. Azzam, R. M. A.; Bashara, N. M. Ellipsometry and Polarized Light; North-Holland: Amsterdam, 1989.
12. Malmsten, M. J. Colloid Interface Sci. 1994, 166, 333.
13. Lekner, J. Theory of Reflection; Martinus Nijhoff Publishers: Dordrecht, 1987.
14. Bedeaux, D.; Vlieger, J. Physica 1973, 67, 55.
15. Haarmans, M. T.; Bedeaux D. Thin Solid Films 1995, 258, 213.
16. 9
17. Mann, E. K.; Heinrich, L.; Voegel, J. C.; Schaaf, P. J. Chem. Phys. 1996, 105, 6082.
18. Heinrich, L.; Mann, E. K.; Voegel, J. C.; Koper, G. J. M.; Schaaf, P. Langmuir 1996, 12, 4857.
19. Bedeaux, D.; Koper, G. J. M.; van der Zeeuw, E. A.; Vlieger, J.; Wind, M. Physica A 1995, 207, 213.
20. Mann, E. K.; van der Zeeuw, E. A.; Koper, G. J. M.; Schaaf, P.; Bedeaux, D.; J. Phys. Chem. 1995, 99, 790.
21. Reference 9 provides a more general expression, allowing anisotropy between the dielectric constants parallel and perpendicular to the interface. A trivial error of a factor of 2 appeared in the reference in going from eqs 3.22 and 3.23. Similarly, a factor of 2 should appear in eq 39, p 68 of ref 7, for agreement with his calculated invariants in Table 3-1 (p 75), which are indeed appropriate for his expression for the reflectivity in eq 50.
22. Jackson, J. D. Classical Electrodynamics, 2nd ed.; John Wiley & Sons: New York, 1975.
23. Schaaf, P.; Déjardin, Ph.; Schmitt, A. Rev. Phys. Appl. 1986, 21, 741. Schaaf, P.; Déjardin, Ph.; Schmitt, A. Langmuir 1987, 3, 1131.
24. Schaaf, P.; Déjardin, Ph.; Schmitt, A. Rev. Phys. Appl. 1986, 21, 741. Schaaf, P.; Déjardin, Ph.; Schmitt, A. Langmuir 1987, 3, 1131.
25. Bevington, P. R. Data Reduction and Error Analysis for the Physical Sciences; McGraw Hill: New York, 1989.
26. Haarmans, M. T.; Bedeaux, D. Thin Solid Films 1993, 224, 117. Haarmans, M. T.; Bedeaux, D Physica A 1994, 207, 340.
27. Haarmans, M. T.; Bedeaux, D. Thin Solid Films 1993, 224, 117. Haarmans, M. T.; Bedeaux, D Physica A 1994, 207, 340.
28. Mann, E. K.; Bollender, A.; Heinrich, L.; Koper, G. J. M.; Schaaf, P. J. Opt. Soc. Am. A 1996, 13, 1046.
29. See, for example, the journal volume dedicated to the subject. Thin Solid Films 1993, 233.
30. Tonova, D.; Konova, A. Surf. Sci. 1996, 349, 221.
31. Bagchi, P.; Birnbaum, S. M. J. Colloid Interface Sci. 1981, 83, 460.
32. Schaaf, P.; Déjardin, Ph.; Schmitt, A. Rev. Phys. Appl. 1986, 21, 741.
33. De Feijter, J. A.; Benjamins, J.; Veer, F. A. Biopolymers 1978, 17, 1759.
34. Frey, W.; Schief, W. R., Jr.; Vogel, V. Langmuir 1996, 12, 1312.
35. Liebmann-Vinson, A.; Lander, L. M.; Foster, M. D.; Britain, W. J.; Vogler, E. A.; Majkrzak, C. F.; Satija, S. Langmuir 1996, 12, 2256.