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Volumn 81, Issue 1, 2001, Pages 9-16

Investigation of stability and reliability of tin oxide thin-film for integrated micro-machined gas sensor devices

Author keywords

CMOS compatible; Integrated sensor; Lifetime; Reliability; Stability

Indexed keywords

ANNEALING; CHEMICAL SENSORS; CMOS INTEGRATED CIRCUITS; CRACKS; DIGITAL SIGNAL PROCESSING; MICROMACHINING; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; THERMAL EFFECTS; TIN COMPOUNDS;

EID: 0035892727     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(01)00920-0     Document Type: Article
Times cited : (63)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.