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Volumn 81, Issue 1, 2001, Pages 9-16
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Investigation of stability and reliability of tin oxide thin-film for integrated micro-machined gas sensor devices
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Author keywords
CMOS compatible; Integrated sensor; Lifetime; Reliability; Stability
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Indexed keywords
ANNEALING;
CHEMICAL SENSORS;
CMOS INTEGRATED CIRCUITS;
CRACKS;
DIGITAL SIGNAL PROCESSING;
MICROMACHINING;
SCANNING ELECTRON MICROSCOPY;
SURFACE STRUCTURE;
THERMAL EFFECTS;
TIN COMPOUNDS;
INTEGRATED SENSORS;
THIN FILM DEVICES;
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EID: 0035892727
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(01)00920-0 Document Type: Article |
Times cited : (63)
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References (9)
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