Contribution of injection in current noise due to generation and recombination of carriers in p-n junctions

Journal of Applied Physics

Volumn 90, Issue 8, 2001, Pages 3998-4006

  Jimenez Tejada J A ^a   Godoy, A ^a   Palma, A ^a   Cartujo, P ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035886289     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1403676     Document Type: Article

References (14)

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