Statistical analysis of early failures in electromigration

Journal of Applied Physics

Volumn 90, Issue 2, 2001, Pages 732-740

  Gall, M ^a   Capasso, C ^a   Jawarani, D ^a,c   Hernandez, R ^a   Kawasaki, H ^a   Ho, P S ^b  

^a MOTOROLA INC   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035878955     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1377304     Document Type: Article

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