Nature of grain boundaries in laser crystallized polycrystalline silicon thin films

Journal of Applied Physics

Volumn 89, Issue 10, 2001, Pages 5348-5354

  Christiansen, S ^a   Lengsfeld, P ^b   Krinke, J ^a   Nerding, M ^a   Nickel, N H ^b   Strunk, H P ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035873481     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1360703     Document Type: Article

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