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Volumn 79, Issue 7, 2001, Pages 967-969
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Improved n+-GaAs/p+-In0.49Ga0.51P/n-GaAs camel-like gate structure for high-breakdown, low-leakage, and high-temperature applications
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035855096
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1394720 Document Type: Article |
Times cited : (4)
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References (11)
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