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Volumn 34, Issue 6, 2001, Pages 1845-1854

Secondary ion mass spectrometry of poly(styrene-co-isoprene) diblock copolymers: Improved surface sensitivity using the high-mass region

(2) Mehl, John T a,b Hercules, David M a

a VANDERBILT UNIVERSITY (United States)

b MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOMOPOLYMERS; SURFACE SENSITIVITY;

IONS; MOLECULAR WEIGHT; POLYISOPRENES; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SILVER; SPECTRUM ANALYSIS; SURFACE REACTIONS; THIN FILMS;

BLOCK COPOLYMERS;

EID: 0035853215 PISSN: 00249297 EISSN: None Source Type: Journal
DOI: 10.1021/ma000544l Document Type: Article

Times cited : (6)

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