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Volumn 328, Issue 1-2, 2001, Pages 2-7

Scanning near-field optical microscopy with a free electron laser: Application in material science and biology

(1)  Cricenti, A a  

a CNR   (Italy)

Author keywords

FEL; Reflectivity; SNOM

Indexed keywords

FREE ELECTRON LASERS; INFRARED RADIATION; LIGHT SOURCES; MATERIALS SCIENCE; OPTICAL PROPERTIES; OPTICAL RESOLVING POWER;

EID: 0035807489     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(01)01322-6     Document Type: Article
Times cited : (4)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.