Scanning near field infrared microscopy using chalcogenide fiber tips

Materials Letters

Volumn 42, Issue 5, 2000, Pages 339-344

  Talley, D B ^a,b   Shaw, L B ^b   Sanghera, J S ^b   Aggarwal, I D ^b   Cricenti, A ^c   Generosi, R ^c   Luce, M ^c   Margaritondo, G ^d   Gilligan, J M ^e   Tolk, N H ^e  

^a UNIVERSITY RESEARCH FOUNDATION   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c CNR   (Italy)

^d EPFL   (Switzerland)

^e VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ARSENIC; COATINGS; ETCHING; FREE ELECTRON LASERS; OPTICAL FIBERS; OPTICAL GLASS; PROBES; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SULFUR COMPOUNDS; SURFACE TOPOGRAPHY;

SCANNING NEAR FIELD INFRARED MICROSCOPY; SELENIDE; SULFIDE;

OPTICAL MICROSCOPY;

EID: 0034140863     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(99)00201-3     Document Type: Article

References (10)

1. E. Betzig J. Trautman T. Harris J. Weiner R. Kostelak Science 251 1991 1468
2. R. Kopelman W.H. Tan Applied Spectroscopy Review 29 1994 39
3. J.K. Trautman J.J. Macklin L.E. Brus E. Betzig Nature 369 1994 40
4. M.H.P. Moers A.G.T. Ruiter A. Jalocha N.F. van Hulst Proceedings SPIE 2535 1995 94
5. W.M. Duncan Materials Research Society Symposium Proceedings 406 1996 183
6. M.K. Hong S. Erramilli P. Huie G. James A. Jeung Proceedings SPIE 2863 1996 54
7. D.T. Shaafsma R. Mossadegh J.S. Sanghera I.D. Aggarwal Ultramicroscopy 77 1999 77
8. M.A. Unger D.A. Kossakovski R. Kongovi J.L. Beauchamp Review of Scientific Instruments 69 1998 2988
9. J.S. Sanghera I.D. Aggarwal Journal of Noncrystalline Solids 213–214 1997 63
10. C. Barchesi A. Cricenti R. Generosi C. Giammichele M. Luce M. Rinaldi Review of Scientific Instruments 68 1997 3799