Comparative study of Sr and Ba adsorption on Si(1 0 0)

Applied Surface Science

Volumn 181, Issue 1-2, 2001, Pages 103-110

  Hu, Xiaoming ^a   Yu, Z ^a   Curless, J A ^a   Droopad, R ^a   Eisenbeiser, K ^a   Edwards Jr , J L ^a   Ooms, W J ^a   Sarid, D ^b  

^a MOTOROLA INC   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

Barium; Low energy electron diffraction; Perovskites; Phase transition; Silicon; Strontium; Ultrahigh vaccum scanning tunneling microscopy

Indexed keywords

ADSORBENTS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; BARIUM; DEPOSITION; HIGH TEMPERATURE EFFECTS; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; PERMITTIVITY; PEROVSKITE; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; STRONTIUM; SURFACE MEASUREMENT; ULTRAHIGH VACUUM;

SURFACE COVERAGES;

SEMICONDUCTING SILICON;

EID: 0035801763     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00379-8     Document Type: Article

References (13)