Automated high-accuracy measuring system for specular micro-reflectivity

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4449, Issue , 2001, Pages 111-118

  Grunwald, Ruediger ^a   Nerreter, Stefan ^a   Tomm, Jens Wolfgang ^a   Schwirzke Schaaf, Sandy ^a   Dörfel, Fabian ^b  

^a MAX BORN INSTITUT   (Germany)

^b University of Applied Sciences Wildau   (Germany)

Author keywords

AR coatings; Diode laser facet; GRIN lenses; Reflectivity; Spatial resolution; Thin film micro optics

Indexed keywords

ANTIREFLECTION COATINGS; AUTOMATION; LIGHT REFLECTION; MAPPING; MICROLENSES; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTOR LASERS; THIN FILMS; TWO DIMENSIONAL;

AUTOMATED HIGH ACCURACY MEASURING; DIODE LASER FACET; GRADIENT INDEX STRUCTURES; LOCK IN TECHNIQUE; MICROOPTICAL COMPONENTS; MICROREFLECTIVITY; SPATIAL RESOLUTION; THIN FILM MICROOPTICS;

MICROOPTICS;

EID: 0035760734     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450084     Document Type: Article

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