Mapping of local complex reflection coefficient variations using a scanning multi-port homodyne interferometer

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volumn , Issue , 2001, Pages 289-

  Jeong, H ^a   Cho, K ^a  

^a Sogang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; ELECTROMAGNETIC WAVE REFLECTION; INTERFEROMETERS; OPTICAL BEAM SPLITTERS; OSCILLATORS (ELECTRONIC); PHOTODIODES; PHOTORESISTS; QUANTUM THEORY; SCANNING;

MULTI-PORT INTERFEROMETERS;

ELECTROMAGNETIC WAVES;

EID: 0034812027     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleo.2001.947816     Document Type: Conference Paper

References (2)

1. Operational approach to the phase of a quantum field
2. Simultaneous measurement of refractive index and thickness of thin film by polarezed reflectances