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Volumn 4346, Issue 2, 2001, Pages 1617-1626

Extreme high NA, high throughput scanner compatible 4 kHz KrF excimer laser for DUV lithography

Author keywords

CoO; Excimer laser; High repetition rate; High throughput; KrF; Lithography; Pulse stretching

Indexed keywords

BANDWIDTH; EXCIMER LASERS; FREQUENCIES; KRYPTON; LENSES; SCANNING;

EID: 0035758728     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.435703     Document Type: Conference Paper
Times cited : (6)

References (5)
  • 3
    • 0033681476 scopus 로고    scopus 로고
    • 130-NM KrF lithography for dram production with 0.68-NA scanner
    • E. Kawamura, K. Nagai, H. Kanamitsu, Y. Tabata, S. Inoue, "130-nm KrF Lithography for dram Production with 0.68-NA Scanner," Proc. SPIE 4000, pp. 927-934, 2000.
    • (2000) Proc. SPIE , vol.4000 , pp. 927-934
    • Kawamura, E.1    Nagai, K.2    Kanamitsu, H.3    Tabata, Y.4    Inoue, S.5
  • 4
    • 23044519796 scopus 로고    scopus 로고
    • Self-sustained volume discharge
    • V V Osipov, "Self-sustained volume discharge," Physics-Uspekhi 43 (3) 221-241,2000.
    • (2000) Physics-Uspekhi , vol.43 , Issue.3 , pp. 221-241
    • Osipov, V.V.1
  • 5
    • 0031384977 scopus 로고    scopus 로고
    • Durability of experimental fused silicas to 193-nm-induced compaction
    • Richard Schenker, F. Piao, W.G. Oldham, "Durability of Experimental Fused Silicas to 193-nm-Induced Compaction",SPIE Vol.3051, 1997, p.44-53.
    • (1997) SPIE , vol.3051 , pp. 44-53
    • Schenker, R.1    Piao, F.2    Oldham, W.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.