Optimum laboratory radiation source for hardness assurance testing

IEEE Transactions on Nuclear Science

Volumn 48, Issue 6 I, 2001, Pages 2152-2157

  Schwank, J R ^a,b   Shaneyfelt, M R ^a,b   Paillet, P ^a,c   Beutler, D E ^a,b   Ferlet Cavrois, V ^a,c   Draper, B L ^b   Loemker, R A ^b   Dodd, P E ^a,b   Sexton, F W ^a,b  

^a IEEE   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c CEA DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON FLUX; RADIATION SOURCES;

COMPUTER SIMULATION; GAMMA RAYS; HARDNESS TESTING; HIGH ENERGY PHYSICS; IRRADIATION; MOSFET DEVICES; PROTON IRRADIATION; THRESHOLD VOLTAGE; X RAYS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0035723245     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983188     Document Type: Conference Paper

References (20)

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