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Volumn 48, Issue 6 I, 2001, Pages 1980-1986
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See analysis of digital InP-based HBT circuits at Gigahertz frequencies
a
IEEE
(United States)
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Author keywords
Heterojunction bipolar transistors; Indium phosphide integrated circuits; Radiation effects; Single event effects (SEEs)
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Indexed keywords
SINGLE-EVENT EFFECTS (SEE);
COMPUTER SIMULATION;
HETEROJUNCTION BIPOLAR TRANSISTORS;
LOGIC CIRCUITS;
RADIATION EFFECTS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR SUPERLATTICES;
DIGITAL INTEGRATED CIRCUITS;
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EID: 0035720585
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.983160 Document Type: Conference Paper |
Times cited : (8)
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References (17)
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