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Volumn 48, Issue 6 I, 2001, Pages 1980-1986

See analysis of digital InP-based HBT circuits at Gigahertz frequencies

Author keywords

Heterojunction bipolar transistors; Indium phosphide integrated circuits; Radiation effects; Single event effects (SEEs)

Indexed keywords

SINGLE-EVENT EFFECTS (SEE);

EID: 0035720585     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983160     Document Type: Conference Paper
Times cited : (8)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.