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Volumn 308-310, Issue , 2001, Pages 734-737
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Diffusion of boron in silicon carbide
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Author keywords
Boron diffusion; Kick out mechanism; Si self interstitial; Silicon carbide
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Indexed keywords
BORON;
CRYSTAL LATTICES;
DIFFUSION;
POINT DEFECTS;
SECONDARY ION MASS SPECTROMETRY;
SUBLATTICES;
SILICON CARBIDE;
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EID: 0035675060
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)00889-4 Document Type: Article |
Times cited : (17)
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References (7)
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