Carrier dynamics in InGaN/GaN SQW structure probed by the transient grating method with subpicosecond pulsed laser

Physica Status Solidi (B) Basic Research

Volumn 228, Issue 1, 2001, Pages 81-84

  Okamoto, K ^a   Kaneta, A ^a   Inoue, K ^a   Kawakami, Y ^a   Terazima, M ^a   Shinomiya, G ^b   Mukai, T ^b   Fujita, S G ^a  

^a KYOTO UNIVERSITY   (Japan)

^b NICHIA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035541063     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200111)228:1<81::AID-PSSB81>3.0.CO;2-F     Document Type: Article

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