Reactive sputter-deposition and characterization of lead oxide films

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 4, 1996, Pages 2207-2214

  Pauleau, Y ^a,b   Harry, E ^a  

^a CEA GRENOBLE   (France)

^b GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030493029     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580048     Document Type: Article

References (14)

1. Y. Pauleau, in Materials and Processes for Surface and Interface Engineering, edited by Y. Pauleau, NATO-ASI Series, Series E: Applied Sciences Vol. 290 (Kluwer Academic, Dordrecht, The Netherlands, 1995), p. 475.
2. M. B. Peterson and R. L. Johnson, Lub. Eng. 13, 203 (1957).
3. Comprehensive Inorganic Chemistry, edited by J. C. Bailar, Jr., H. J. Emeleus, R. Nyholm, and A. F. Trotman-Dickenson (Pergamon, Oxford, 1973), Vol. 2, p. 119.
4. K. Wasa and S. Hayakawa, Jpn. J. Appl. Phys. 8, 276 (1969).
5. M. L. Lieberman and R. C. Medrud, J. Electrochem. Soc. 116, 242 (1969).
6. A. Czapla and M. Jachimowski, Phys. Status Solidi A 7, K79 (1971).
7. A. Czapla, M. Jachimowski. and E. Kusior, Acta Phys. Pol. A 41, 149 (1972).
8. L. C. Schumacher, I. B. Holzhueter, and M. J. Dignam, J. Electroanal. Chem. 261, 331 (1989).
9. A. Brenner and S. Senderoff, J. Res. Natl. Bur. Stand. 42, 105 (1949).
10. W. A. Brantley, J. Appl. Phys. 44, 534 (1973).
11. Joint Committee on Powder Diffraction Standards Data Cards 4-686, International Center for Diffraction Data, Swathmore, PA, 1994.
12. Joint Committee on Powder Diffraction Standards Data Cards 38-1477, International Center for Diffraction Data, Swathmore, PA, 1993.
13. Joint Committee on Powder Diffraction Standards Data Cards 26-577, International Center for Diffraction Data, Swathmore, PA, 1994.
14. R. W. Hoffman, in Physics of Thin Films, edited by G. Hass and R. E. Thun (Academic, New York, 1966), Vol. 3, p. 211.