Surface morphology of Ga adsorbed Si(1 1 3) surface

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 166-172

  Suzuki, H ^a   Nakahara, H ^a   Miyata, S ^a   Ichimiya, A ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Gallium; High index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

GALLIUM; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACE STRUCTURE;

SURFACE RECONSTRUCTION;

SEMICONDUCTING SILICON;

EID: 0035501196     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01208-0     Document Type: Conference Paper

References (14)