Structure of Si(112):Ga-(N×1) reconstructions

Surface Science

Volumn 423, Issue 2, 1999, Pages

  Baski, A A ^a   Erwin, S C ^b   Whitman, L J ^b  

^a VIRGINIA COMMONWEALTH UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHEMICAL BONDS; COMPUTATIONAL METHODS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; INTERFACIAL ENERGY; MORPHOLOGY; SEMICONDUCTING GALLIUM; SEMICONDUCTING SILICON; STRAIN; SURFACE ROUGHNESS;

DENSITY FUNCTIONAL THEORY (DFT); HIGH INDEX SINGLE CRYSTALS; SURFACE RECONSTRUCTION;

SINGLE CRYSTALS;

EID: 0345103241     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00005-9     Document Type: Article

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