In-situ REM study of Au-induced faceting on Si(113) surface

Surface Science

Volumn 438, Issue 1-3, 1999, Pages 91-96

  Kurahashi, N ^a   Minoda, H ^a   Tanishiro, Y ^a   Yagi, K ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CRYSTAL ORIENTATION; DEPOSITION; ELECTRON MICROSCOPY; GOLD; HIGH TEMPERATURE OPERATIONS; INTERFACIAL ENERGY; MORPHOLOGY; NUCLEATION; SURFACE STRUCTURE; SURFACE TREATMENT; SURFACES;

FOUR FOLD STRUCTURE; GOLD INDUCED FACETING; REFLECTION ELECTRON MICROSCOPY;

SEMICONDUCTING SILICON;

EID: 0033351353     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00556-7     Document Type: Article

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