Measurement system for a preliminary characterization of flash memory cells for multilevel applications

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 5, 1998, Pages 1385-1390

  Bucci, Giovanni ^a   Faccio, Marco ^a   Landi, Carmine ^a   Marotta, G ^b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

Automatic testing; Component characterization; Measurement system; Memories; Testing

Indexed keywords

AUTOMATIC TESTING; MICROPROCESSOR CHIPS;

FLASH MEMORY CELLS;

NONVOLATILE STORAGE;

EID: 0032180185     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.746615     Document Type: Article

References (7)

1. K. Takeuchi, T. Tanaka, and H. Nakamura, "A double-level-Vth select gate array architecture for multilevel NAND flash memories," IEEE J. Solid-State Circuits, vol. 31, no. 4, p. 602, 1996.
2. G. Marotta et al., "A high speed embedded flash memory for DSP and MCU applications" in Proc. European Microprocessor and Microcontroller Sem., 1996.
3. TMS29F040 4194304-Bit Flash Memory, Product Data information SMJS820A, Texas Instrument, Apr. 1996.
4. S. Aritome et al., "Reliability issues of flash memories" Proc. IEEE, vol. 81, pp. 776-786, May 1993.
5. G. Bucci, A. Germano, and C. Landi, "Virtual instrument based on real-time measurement apparatus," in Proc. IMTC'94, vol. 1, Hamamatsu, Japan, May 10-12, 1994, pp. 357-360.
6. G. Bucci and C. Landi, "VXI-based virtual instrument in undergraduate measurement laboratory experiments," in Proc. IMTC'97, Ottawa, Ont., Canada, May 19-21, 1997.
7. _, "Implementation of a virtual network analyzer by means of VXI-based modules," in Proc. IMTC'97, Ottawa, Ont., Canada, May 19-21, 1997.