Efficient electromigration testing with a single current source

Review of Scientific Instruments

Volumn 72, Issue 10, 2001, Pages 3962-3967

  Kim, Choong Un ^a   Michael, N L ^a   Jiang, Qing Tang ^b,c   Augur, Rod ^b,d  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b SEMATECH   (United States)

^c TEXAS INSTRUMENTS   (United States)

^d NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035471658     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1400153     Document Type: Article

References (8)

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